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 Features

HIGH-SPEED 2.5V 256/128K x 36 ASYNCHRONOUS DUAL-PORT STATIC RAM WITH 3.3V 0R 2.5V INTERFACE

PRELIMINARY IDT70T651/9S

True Dual-Port memory cells which allow simultaneous access of the same memory location High-speed access - Commercial: 8/10/12/15ns (max.) - Industrial: 10/12ns (max.) RapidWrite Mode simplifies high-speed consecutive write cycles Dual chip enables allow for depth expansion without external logic IDT70T651/9 easily expands data bus width to 72 bits or more using the Master/Slave select when cascading more than one device M/S = VIH for BUSY output flag on Master, M/S = VIL for BUSY input on Slave


Busy and Interrupt Flags On-chip port arbitration logic Full on-chip hardware support of semaphore signaling between ports Fully asynchronous operation from either port Separate byte controls for multiplexed bus and bus matching compatibility Sleep Mode Inputs on both ports Supports JTAG features compliant to IEEE 1149.1 Single 2.5V (100mV) power supply for core LVTTL-compatible, selectable 3.3V (150mV)/2.5V (100mV) power supply for I/Os and control signals on each port Available in a 256-ball Ball Grid Array, 208-pin Plastic Quad Flatpack and 208-ball fine pitch Ball Grid Array. Industrial temperature range (-40C to +85C) is available for selected speeds
Functional Block Diagram
BE3L BE2L BE1L BE0L BE3R BE2R BE1R BE0R
R/WL
CE0L CE1L
BB EE 01 LL BB EE 23 LL BBBB EEEE 3210 R RRR
R/WR
CE0R CE1R
OEL
Dout0-8_L Dout0-8_R Dout9-17_L Dout9-17_R Dout18-26_L Dout18-26_R Dout27-35_L Dout27-35_R
OER
256/128K x 36 MEMORY ARRAY I/O0L- I/O35L
Di n_L Di n_R
I/O0R -I/O35R
A17L(1) A0L
Address Decoder
ADDR_L
ADDR_R
Address Decoder
A17R(1) A0R
CE0L CE1L OEL R/WL BUSYL (2,3) SEML INTL(3)
ZZL
(4)
ARBITRATION INTERRUPT SEMAPHORE LOGIC
OER R/WR
CE0R CE1R
TDI TD O
JTAG
TC K TMS TRST
M/S
BUSYR(2,3) SEMR INTR(3)
ZZR
(4)
LOGIC NOTES: 1. Address A17x is a NC for IDT70T659. 2. BUSY is an input as a Slave (M/S=VIL) and an output when it is a Master (M/S=VIH). 3. BUSY and INT are non-tri-state totem-pole outputs (push-pull). 4. The sleep mode pin shuts off all dynamic inputs, except JTAG inputs, when asserted. OPTx, INTx, M/S and the sleep mode pins themselves (ZZx) are not affected during sleep mode.
ZZ CONTROL
4869 drw 01
NOVEMBER 2003
DSC-5632/3
1
(c)2003 Integrated Device Technology, Inc.
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
The IDT70T651/9 is a high-speed 256/128K x 36 Asynchronous Dual-Port Static RAM. The IDT70T651/9 is designed to be used as a stand-alone 9216/4608K-bit Dual-Port RAM or as a combination MASTER/SLAVE Dual-Port RAM for 72-bit-or-more word system. Using the IDT MASTER/SLAVE Dual-Port RAM approach in 72-bit or wider memory system applications results in full-speed, error-free operation without the need for additional discrete logic. This device provides two independent ports with separate control, address, and I/O pins that permit independent, asynchronous access for reads or writes to any location in memory. An automatic power down
Description
feature controlled by the chip enables (either CE0 or CE1) permit the on-chip circuitry of each port to enter a very low standby power mode. The IDT70T651/9 has a RapidWrite Mode which allows the designer to perform back-to-back write operations without pulsing the R/W input each cycle. This is especially significant at the 8 and 10ns cycle times of the IDT70T651/9, easing design considerations at these high performance levels. The 70T651/9 can support an operating voltage of either 3.3V or 2.5V on one or both ports, controlled by the OPT pins. The power supply for the core of the device (VDD) is at 2.5V.
2
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Pin Configuration(1,2,3)
70T651/9BC BC-256(5,6) 256-Pin BGA Top View
A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 A13 A14 A15 A16
03/18/03
A1
NC
B1
TDI
B2
NC
B3
A17L(4) A14L
B4 B5
A11L
B6
A8L
B7
BE2L
B8
CE1L
B9
OEL
B10
INTL
B11
A5L
B12
A2L
B13
A0L
B14
NC
B15
NC
B16
I/O18L
C1
NC
C2
TDO
C3
NC
C4
A15L
C5
A12L
C6
A9L
C7
BE3L
C8
CE0L R/WL
C9 C10
NC
C11
A4L
C12
A1L
C13
NC
C14
I/O17L
C15
NC
C16
I/O18R I/O19L VSS
D1 D2 D3
A16L
D4
A13L
D5
A10L
D6
A7L
D7
BE1L BE0L SEML BUSYL A6L
D8 D9 D10 D11 D12
A3L
D13
OPTL I/O17R I/O16L
D14 D15 D16
I/O20R I/O19R I/O20L
E1 E2 E3
VDD
E4
VDDQL VDDQL VDDQR VDDQR VDDQL VDDQL VDDQR VDDQR VDD I/O15R I/O15L I/O16R
E5 E6 E7 E8 E9 E10 E11 E12 E13 E14 E15 E16
I/O21R I/O21L I/O22L VDDQL VDD
F1 F2 F3 F4 F5
VDD
F6
VSS
F7
VSS
F8
VSS
F9
VSS
F10
VDD
F11
VDD VDDQR I/O13L I/O14L I/O14R
F12 F13 F14 F15 F16
I/O23L I/O22R I/O23R VDDQL VDD
G1 G2 G3 G4 G5
NC
G6
VSS
G7
VSS
G8
VSS
G9
VSS
G10
VSS
G11
VDD VDDQR I/O12R I/O13R I/O12L
G12 G13 G14 G15 G16
I/O24R I/O24L I/O25L VDDQR VSS
H1 H2 H3 H4 H5
VSS
H6
VSS
H7
VSS
H8
VSS
H9
VSS
H10
VSS
H11
VSS
H12
VDDQL I/O10L I/O11L I/O11R
H13 H14 H15 H16
I/O26L I/O25R I/O26R VDDQR VSS
J1 J2 J3 J4 J5
VSS
J6
VSS
J7
VSS
J8
VSS
J9
VSS
J10
VSS
J11
VSS
J12
VDDQL I/O9R
J13 J14
IO9L I/O10R
J15 J16
I/O27L I/O28R I/O27R VDDQL ZZR
K1 K2 K3 K4 K5
VSS
K6
VSS
K7
VSS
K8
VSS
K9
VSS
K10
VSS
K11
ZZL VDDQR I/O8R I/O7R I/O8L
K12 K13 K14 K15 K16
I/O29R I/O29L I/O28L VDDQL VSS
L1 L2 L3 L4 L5
VSS
L6
VSS
L7
VSS
L8
VSS
L9
VSS
L10
VSS
L11
VSS
L12
VDDQR I/O6R I/O6L I/O7L
L13 L14 L15 L16
I/O30L I/O31R I/O30R VDDQR VDD
M1 M2 M3 M4 M5
NC
M6
VSS
M7
VSS
M8
VSS
M9
VSS
M10
VSS
M11
VDD
M12
VDDQL I/O5L
M13 M14
I/O4R I/O5R
M15 M16
I/O32R I/O32L I/O31L VDDQR
N1 N2 N3 N4
VDD
N5
VDD
N6
VSS
N7
VSS
N8
VSS
N9
VSS
N10
VDD
N11
VDD VDDQL I/O3R I/O3L I/O4L
N12 N13 N14 N15 N16
I/O33L I/O34R I/O33R VDD VDDQR VDDQR VDDQL VDDQL VDDQR VDDQR VDDQL VDDQL VDD
P1 P2 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13
I/O2L
P14
I/O1R I/O2R
P15 P16
I/O35R I/O34L TMS
R1 R2 R3
A16R
R4
A13R
R5
A10R
R6
A7R
R7
BE1R BE0R SEMR BUSYR
R8 R9 R10 R11
A6R
R12
A3R
R13
I/O0L I/O0R
R14 R15
I/O1L
R16
I/O35L
T1
NC
T2
TRST
T3
NC
T4
A15R
T5
A12R
T6
A9R
T7
BE3R CE0R R/WR
T8 T9 T10
M/S
T11
A4R
T12
A1R
T13
OPTR
T14
NC
T15
NC
T16
,
NC
TCK
NC
A17R(4) A14R
A11R
A8R
BE2R CE1R OER
INTR
A5R
A2R
A0R
NC
NC
5632 drw 02f
NOTES: 1. All VDD pins must be connected to 2.5V power supply. 2. All VDDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VDD (2.5V), and 2.5V if OPT pin for that port is set to VSS (0V). 3. All VSS pins must be connected to ground supply. 4. A17X is a NC for IDT70T659. 5. Package body is approximately 17mm x 17mm x 1.4mm, with 1.0mm ball-pitch. 6. This package code is used to reference the package diagram.
,
3
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Pin Configurations(1,2,3) (con't.)
VSS VDDQR I/O18R I/O18L VSS VDD TDI TDO NC NC A17L(4) A16L A15L A14L A13L A12L A11L A10L A9L A8L A7L BE3L BE2L BE1L BE0L CE1L CE0L VDD VDD VSS VSS SEML OEL R/WL BUSYL INTL NC A6L A5L A4L A3L A2L A1L A0L VDD VDD VSS OPTL I/O17L I/O17R VDDQR VSS 208 207 206 205 204 203 202 201 200 199 198 197 196 195 194 193 192 191 190 189 188 187 186 185 184 183 182 181 180 179 178 177 176 175 174 173 172 171 170 169 168 167 166 165 164 163 162 161 160 159 158 157
03/18/03
53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104
I/O19L I/O19R I/O20L I/O20R VDDQL VSS I/O21L I/O21R I/O22L I/O22R VDDQR VSS I/O23L I/O23R I/O24L I/O24R VDDQL VSS I/O25L I/O25R I/O26L I/O26R VDDQR ZZR VDD VDD VSS VSS VDDQL VSS I/O27R I/O27L I/O28R I/O28L VDDQR VSS I/O29R I/O29L I/O30R I/O30L VDDQL VSS I/O31R I/O31L I/O32R I/O32L VDDQR VSS I/O33R I/O33L I/O34R I/O34L
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52
70T651/9DR DR-208(5,6,7) 208-Pin PQFP Top View(8)
156 155 154 153 152 151 150 149 148 147 146 145 144 143 142 141 140 139 138 137 136 135 134 133 132 131 130 129 128 127 126 125 124 123 122 121 120 119 118 117 116 115 114 113 112 111 110 109 108 107 106 105
I/O16L I/O16R I/O15L I/O15R VSS VDDQL I/O14L I/O14R I/O13L I/O13R VSS VDDQR I/O12L I/O12R I/O11L I/O11R VSS VDDQL I/O10L I/O10R I/O9L I/O9R VSS VDDQR VDD VDD VSS VSS ZZL VDDQL I/O8R I/O8L I/O7R I/O7L VSS VDDQR I/O6R I/O6L I/O5R I/O5L VSS VDDQL I/O4R I/O4L I/O3R I/O3L VSS VDDQR I/O2R I/O2L I/O1R I/O1L
5632 drw 02d
NOTES: 1. All VDD pins must be connected to 2.5V power supply. 2. All VDDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VDD (2.5V) and 2.5V if OPT pin for that port is set to VSS (0V). 3. All VSS pins must be connected to ground. 4. A17X is a NC for IDT70T659. 5. Package body is approximately 28mm x 28mm x 3.5mm. 6. This package code is used to reference the package diagram. 7. 8ns Commercial and 10ns Industrial speed grades are not available in the DR-208 package. 8. This text does not indicate orientation of the actual part-marking.
VSS VDDQL I/O35R I/O35L VDD TMS TCK TRST NC NC A17R(4) A16R A15R A14R A13R A12R A11R A10R A9R A8R A7R BE3R BE2R BE1R BE0R CE1R CE0R VDD VDD VSS VSS SEMR OER R/WR BUSYR INTR M/S A6R A5R A4R A3R A2R A1R A0R VDD VSS VSS OPTR I/O0L I/O0R VDDQL VSS
4
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Pin Configurations(1,2,3)(con't.)
03/18/03
1 A B C D E F G H J K L M N P R T U
I/O19L
2
I/O18L
3
VSS
4
TDO
5
NC
6
A16L
7
A12L
8
A8L
9
BE1L
10 11
VDD
12
INTL
13 14
A4L A0L
15
OPTL
16 17
I/O17L VSS
SEML
A B C D E F G H J K L M N P R T U
I/O20R
VSS
I/O18R
TDI
A17L (4)
A13L
A9 L
BE2L BE3L
CE0L
VSS
BUSYL
A5L
A1L
VSS
VDDQR
I/O16L I/O15R
VDDQL
I/O19R
VDDQR
VDD
NC
A14L
A10L
CE1L
VSS
R/WL
A6L
A2L
VDD
I/O16R
I/O15L
VSS
I/O22L
VSS
I/O21L
I/O20L
A15L
A11L
A7L
BE0L
VDD
OEL
NC
A3L
VDD
I/O17R
VDDQL
I/O14L I/O14R
I/O23L
I/O22R
VDDQR I/O21R
I/O12L
I/O13R
VSS
I/O13L
VDDQL
I/O23R
I/O24L
VSS
VSS
I/O12R
I/O11L
VDDQR
I/O26L
VSS
I/O25L
I/O24R
I/O9L
VDDQL
I/O10L I/O11R
VDD
I/O26R
VDDQR I/O25R
70T651/9BF BF-208(5,6) 208-Ball fpBGA Top View(7)
VDD
I/O9R
VSS
I/O10R
VDDQL
VDD
VSS
ZZR
ZZL
VDD
VSS
VDDQR
I/O28R
VSS
I/O27R
VS S
I/O7R
VDDQL
I/O8R
VSS
I/O29R
I/O28L
VDDQR
I/O27L
I/O6R
I/O7L
VSS
I/O8L
VDDQL
I/O29L
I/O30R
VSS
VSS
I/O6L
I/O5R
VDDQR
I/O31L
VSS
I/O31R
I/O30L
I/O3R
VDDQL
I/O4R
I/O5L
I/O32R
I/O32L
VDDQR I/O35R
TRST
A16R
A12R
A8R
BE1R
VDD
SEMR
INTR
A4R
I/O2L
I/O3L
VSS
I/O4L
VSS
I/O33L
I/O34R
TCK
A17R(4)
A13R
A9R
BE2R BE3R
CE0R
CE1R
VSS
BUSYR
A5R
A1R
VSS
VDDQL
I/O1R
VDDQR
I/O33R
I/O34L
VDDQL
TMS
NC
A14R
A10R
VSS
R/WR
A6R
A2R
VS S
I/O 0R
VSS
I/O2R
VSS
I/O35L
VDD
NC
A15R
A11R
A7R
BE0R
VDD
OER
M/S
A3R
A0R
VDD
OPTR
I/O0L
I/O1L
5632 drw 02e
NOTES: 1. All VDD pins must be connected to 2.5V power supply. 2. All VDDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VDD (2.5V) and 2.5V if OPT pin for that port is set to VSS (0V). 3. All VSS pins must be connected to ground. 4. A17X is a NC for IDT70T659. 5. Package body is approximately 15mm x 15mm x 1.4mm with 0.8mm ball pitch. 6. This package code is used to reference the package diagram. 7. This text does not indicate orientation of the actual part-marking.
5
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Pin Names
Left Port CE0L, CE1L R/WL OEL A0L - A17L
(1)
Right Port CE0R, CE1R R/WR OER A0R - A17R
(1)
Names Chip Enables (Input) Read/Write Enable (Input) Output Enable (Input) Address (Input) Data Input/Output Semaphore Enable (Input) Interrupt Flag (Output) Busy Flag (Output) Byte Enables (9-bit bytes) (Input) Power (I/O Bus) (3.3V or 2.5V)(2) (Input) Option for selecting VDDQX(2,3) (Input) Sleep Mode Pin(4) (Input) Master or Slave Select (Input)(5) Power (2.5V)(2) (Input) Ground (0V) (Input) Test Data Input Test Data Output Test Logic Clock (10MHz) (Input) Test Mode Select (Input) Reset (Initialize TAP Controller) (Input)
5632 tbl 01
I/O0L - I/O35L SEML INTL BUSYL BE0L - BE3L VDDQL OPTL ZZL
I/O0R - I/O35R SEMR INTR BUSYR BE0R - BE3R VDDQR OPTR ZZR M/S VDD VSS TDI TDO TCK TMS TRST
NOTES: 1. Address A17x is a NC for IDT70T659. 2. VDD, OPTX, and VDDQX must be set to appropriate operating levels prior to applying inputs on I/OX. 3. OPTX selects the operating voltage levels for the I/Os and controls on that port. If OPTX is set to VDD (2.5V), then that port's I/Os and controls will operate at 3.3V levels and VDDQX must be supplied at 3.3V. If OPTX is set to VSS (0V), then that port's I/Os and controls will operate at 2.5V levels and VDDQX must be supplied at 2.5V. The OPT pins are independent of one another--both ports can operate at 3.3V levels, both can operate at 2.5V levels, or either can operate at 3.3V with the other at 2.5V. 4. The sleep mode pin shuts off all dynamic inputs, except JTAG inputs, when asserted. OPTx, INTx, M/S and the sleep mode pins themselves (ZZx) are not affected during sleep mode. It is recommended that boundry scan not be operated during sleep mode. 5. BUSY is an input as a Slave (M/S=VIL) and an output when it is a Master (M/S=VIH).
6
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Truth Table I--Read/Write and Enable Control(1,2)
OE X X X X X X X X X X L L L L L L L H X SEM H H H H H H H H H H H H H H H H H H X CE0 H X L L L L L L L L L L L L L L L L X CE1 X L H H H H H H H H H H H H H H H H X BE3 X X H H H H L H L L H H H L H L L L X BE2 X X H H H L H H L L H H L H H L L L X BE1 X X H H L H H L H L H L H H L H L L X BE0 X X H L H H H L H L L H H H L H L L X R/W X X X L L L L L L L H H H H H H H X X ZZ L L L L L L L L L L L L L L L L L L H Byte 3 I/O27-35 High-Z High-Z High-Z High-Z High-Z High-Z DIN High-Z DIN DIN High-Z High-Z High-Z DOUT High-Z DOUT DOUT High-Z High-Z Byte 2 I/O18-26 High-Z High-Z High-Z High-Z High-Z DIN High-Z High-Z DIN DIN High-Z High-Z DOUT High-Z High-Z DOUT DOUT High-Z High-Z Byte 1 I/O9-17 High-Z High-Z High-Z High-Z DIN High-Z High-Z DIN High-Z DIN High-Z DOUT High-Z High-Z DOUT High-Z DOUT High-Z High-Z Byte 0 I/O0-8 High-Z High-Z High-Z DIN High-Z High-Z High-Z DIN High-Z DIN DOUT High-Z High-Z High-Z DOUT High-Z DOUT High-Z High-Z MODE Deselected-Power Down Deselected-Power Down All Bytes Deselected Write to Byte 0 Only Write to Byte 1 Only Write to Byte 2 Only Write to Byte 3 Only Write to Lower 2 Bytes Only Write to Upper 2 bytes Only Write to All Bytes Read Byte 0 Only Read Byte 1 Only Read Byte 2 Only Read Byte 3 Only Read Lower 2 Bytes Only Read Upper 2 Bytes Only Read All Bytes Outputs Disabled High-Z Sleep Mode
5632 tbl 02
NOTES: 1. "H" = VIH, "L" = VIL, "X" = Don't Care. 2. It is possible to read or write any combination of bytes during a given access. A few representative samples have been illustrated here.
Truth Table II - Semaphore Read/Write Control(1)
Inputs(1) CE(2) H H L R/W H X OE L X X BE3 L X X BE2 L X X BE1 L X X BE0 L L X SEM L L L Outputs I/O1-35 DATAOUT X
______
I/O0 DATAOUT DATAIN
______
Mode Read Data in Semaphore Flag(3) Write I/O0 into Semaphore Flag Not Allowed
5632 tbl 03
NOTES: 1. There are eight semaphore flags written to I/O0 and read from all the I/Os (I/O0-I/O35). These eight semaphore flags are addressed by A0-A2. 2. CE = L occurs when CE0 = VIL and CE1 = VIH. CE = H when CE0 = VIH and/or CE1 = VIL. 3. Each byte is controlled by the respective BEn. To read data BEn = VIL.
7
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Recommended Operating Temperature and Supply Voltage(1)
Grade Commercial Industrial Ambient Temperature 0OC to +70OC -40OC to +85OC GND 0V 0V VDD 2.5V + 100mV 2.5V + 100mV
5632 tbl 04
Recommended DC Operating Conditions with VDDQ at 2.5V
Symbol VDD VDDQ VSS VIH Parameter Core Supply Voltage I/O Supply Voltage Ground Input High Volltage (Address, Control & Data I/O Inputs)(3) Input High Voltage JTAG
_ (3)
Min. 2.4 2.4 0 1.7
Typ. 2.5 2.5 0
____
Max. 2.6 2.6 0 VDDQ + 100mV (2)
Unit V V V V
NOTE: 1. This is the parameter TA. This is the "instant on" case temperature.
VIH
1.7 VDD - 0.2V -0.3(1) -0.3(1)
____
VDD + 100mV(2) VDD + 100mV(2) 0.7 0.2
V V V V
5632 tbl 05
Capacitance(1)
Symbol CIN COUT(3)
VIH VIL
(TA = +25C, F = 1.0MHZ) PQFP ONLY
Parameter Input Capacitance Output Capacitance Conditions(2) VIN = 3dV VOUT = 3dV Max. 8 10.5 Unit pF pF
5632 tbl 08
Input High Voltage ZZ, OPT, M/S Input Low Voltage Input Low Voltage ZZ, OPT, M/S
____
____
VIL
____
NOTES: 1. These parameters are determined by device characterization, but are not production tested. 2. 3dV references the interpolated capacitance when the input and output switch from 0V to 3V or from 3V to 0V. 3. COUT also references CI/O.
NOTES: 1. VIL (min.) = -1.0V for pulse width less than tRC/2 or 5ns, whichever is less. 2. VIH (max.) = VDDQ + 1.0V for pulse width less than tRC/2 or 5ns, whichever is less. 3. To select operation at 2.5V levels on the I/Os and controls of a given port, the OPT pin for that port must be set to VSS(0V), and VDDQX for that port must be supplied as indicated above.
Absolute Maximum Ratings(1)
Symbol VTERM (VDD) VTERM(2) (VDDQ) VTERM(2) (INPUTS and I/O's) TBIAS(3) TSTG TJN Rating VDD Terminal Voltage with Respect to GND VDDQ Terminal Voltage with Respect to GND Input and I/O Terminal Voltage with Respect to GND Temperature Under Bias Storage Temperature Junction Temperature Commercial & Industrial -0.5 to 3.6 -0.3 to VDDQ + 0.3 -0.3 to VDDQ + 0.3 -55 to +125 -65 to +150 +150 50 40 Unit V V V
o
Recommended DC Operating Conditions with VDDQ at 3.3V
Symbol VDD VDDQ VSS VIH Parameter Core Supply Voltage I/O Supply Voltage (3) Ground Input High Voltage (Address, Control &Data I/O Inputs)(3) Input High Voltage JTAG
_
Min. 2.4 3.15 0 2.0
Typ. 2.5 3.3 0
____
Max. 2.6 3.45 0 VDDQ + 150mV(2)
Unit V V V V
VIH VIH VIL VIL
1.7 VDD - 0.2V -0.3(1) -0.3
(1)
____
VDD + 100mV (2) VDD + 100mV (2) 0.8 0.2
V V V V
5632 tbl 06
C C C
Input High Voltage ZZ, OPT, M/S Input Low Voltage Input Low Voltage ZZ, OPT, M/S
____
____
o
____
o
IOUT(For VDDQ = 3.3V) DC Output Current IOUT(For VDDQ = 2.5V) DC Output Current
mA mA
5632 tbl 07
NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. This is a steady-state DC parameter that applies after the power supply has reached its nominal operating value. Power sequencing is not necessary; however, the voltage on any Input or I/O pin cannot exceed VDDQ during power supply ramp up. 3. Ambient Temperature under DC Bias. No AC Conditions. Chip Deselected.
NOTES: 1. VIL (min.) = -1.0V for pulse width less than tRC/2 or 5ns, whichever is less. 2. VIH (max.) = VDDQ + 1.0V for pulse width less than tRC/2 or 5ns, whichever is less. 3. To select operation at 3.3V levels on the I/Os and controls of a given port, the OPT pin for that port must be set to VDD (2.5V), and VDDQX for that port must be supplied as indicated above.
8
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range (VDD = 2.5V 100mV)
70T651/9S Symbol |ILI| |ILI| |ILO| VOL (3.3V) VOH (3.3V) VOL (2.5V) VOH (2.5V) Parameter Input Leakage Current(1) JTAG & ZZ Input Leakage Current Output Leakage Current Output Low Voltage (1) Output High Voltage
(1) (1,3) (1,2)
Test Conditions VDDQ = Max., VIN = 0V to VDDQ VDD = Max., VIN = 0V to VDD CE0 = VIH or CE1 = VIL, VOUT = 0V to VDDQ IOL = +4mA, VDDQ = Min. IOH = -4mA, VDDQ = Min. IOL = +2mA, VDDQ = Min. IOH = -2mA, VDDQ = Min.
Min.
___ ___ ___ ___
Max. 10 +30 10 0.4
___
Unit A A A V V V V
5632 tbl 09
2.4
___
Output Low Voltage (1) Output High Voltage (1)
0.4
___
2.0
NOTES: 1. VDDQ is selectable (3.3V/2.5V) via OPT pins. Refer to page 6 for details. 2. Applicable only for TMS, TDI and TRST inputs. 3. Outputs tested in tri-state mode.
DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range(3) (VDD = 2.5V 100mV)
70T651/9S8(7) Com'l Only Symbol IDD Parameter Dynamic Operating Current (Both Ports Active) Standby Current (Both Ports - TTL Level Inputs) Standby Current (One Port - TTL Level Inputs) Test Condition CEL and CER= VIL, Outputs Disabled f = fMAX(1) CEL = CER = VIH f = fMAX(1) CE"A" = VIL and CE"B" = VIH(5) Active Port Outputs Disabled, f = fMAX(1) Version COM'L IND COM'L IND COM'L IND COM'L IND
(5)
70T651/9S10 Com'l & Ind(7) Typ.(4) 300 300 90 90 200 200 2 2 200 200 2 2 Max. 405 445 120 145 265 290 10 20 265 290 10 20
70T651/9S12 Com'l & Ind Typ.(4) 300 300 75 75 180 180 2 2 180 180 2 2 Max. 355 395 105 130 230 255 10 20 230 255 10 20
70T651/9S15 Com'l Only Typ.(4) 225
____
Typ.(4) S S S S S S S S S S S S 350
____
Max. 475
____
Max. 305
____
Unit mA
ISB1
(6)
115
____
140
____
60
____
85
____
mA
ISB2(6)
240
____
315
____
150
____
200
____
mA
ISB3
Full Standby Current Both Ports CEL and (Both Ports - CMOS CER > VDD - 0.2V, VIN > VDD - 0.2V Level Inputs) or VIN < 0.2V, f = 0(2) Full Standby Current (One Port - CMOS Level Inputs) Sleep Mode Current (Both Ports - TTL Level Inputs)
2
____
10
____
2
____
10
____
mA
ISB4
(6)
CE"A" < 0.2V and CE"B" > VDD - 0.2V COM'L VIN > VDD - 0.2V or VIN < 0.2V, Active IND Port, Outputs Disabled, f = fMAX(1) ZZL = ZZR = VIH f = fMAX(1) COM'L IND
240
____
315
____
150
____
200
____
mA
IZZ
2
____
10
____
2
____
10
____
mA
5632 tbl 10 NOTES: 1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/tRC, using "AC TEST CONDITIONS" at input levels of GND to 3.3V. 2. f = 0 means no address or control lines change. Applies only to input at CMOS level standby. 3. Port "A" may be either left or right port. Port "B" is the opposite from port "A". 4. VDD = 3.3V, TA = 25C for Typ, and are not production tested. IDD DC(f=0) = 100mA (Typ). 5. CEX = VIL means CE0X = VIL and CE1X = VIH CEX = VIH means CE0X = VIH or CE1X = VIL CEX < 0.2V means CE0X < 0.2V and CE1X > VDDQX - 0.2V CEX > VDDQX - 0.2V means CE0X > VDDQX - 0.2V or CE1X < 0.2V. "X" represents "L" for left port or "R" for right port. 6. ISB1, ISB2 and ISB4 will all reach full standby levels (ISB3) on the appropriate port(s) if ZZL and /or ZZR = VIH. 7. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
9
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
AC Test Conditions (VDDQ - 3.3V/2.5V)
Input Pulse Levels Input Rise/Fall Times Input Timing Reference Levels Output Reference Levels Output Load GND to 3.0V / GND to 2.4V 2ns Max. 1.5V/1.25V 1.5V/1.25V Figure 1
5632 tbl 11
50 DATAOUT
50 1.5V/1.25 10pF (Tester)
,
5632 drw 03
Figure 1. AC Output Test load.
4 3.5 3
tAA/tACE
(Typical, ns)
2.5 2 1.5 1 0.5 0 0 20
40
60
80
100
120
140
160
Capacitance (pF) from AC Test Load
5632 drw 05
Figure 3. Typical Output Derating (Lumped Capacitive Load).
10
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range(4)
70T651/9S8(5) Com'l Only Symbol READ CYCLE tRC tAA tACE tABE tAOE tOH tLZ tLZOB tHZ tPU tPD tSOP tSAA tSOE Read Cycle Time Address Access Time Chip Enable Access Time
(3)
70T651/9S10 Com'l & Ind(5) Min. Max.
70T651/9S12 Com'l & Ind Min. Max.
70T651/9S15 Com'l Only Min. Max. Unit
Parameter
Min.
Max.
8
____ ____ ____ ____
____
10
____ ____ ____ ____
____
12
____ ____ ____ ____
____
15
____ ____ ____ ____
____
ns ns ns ns ns ns ns ns ns ns ns ns ns ns
5632tbl 12
8 8 4 4
____ ____ ____
10 10 5 5
____ ____ ____
12 12 6 6
____ ____ ____
15 15 7 7
____ ____ ____
Byte Enable Access Time (3) Output Enable Access Time Output Hold from Address Change Output Low-Z Time Chip Enable and Semaphore (1,2) Output Low-Z Time Output Enable and Byte Enable Output High-Z Time
(1,2) (1,2)
3 3 0 0 0
3 3 0 0 0
____ ____
3 3 0 0 0
____ ____
3 3 0 0 0
____ ____
3.5
____
4
____
6
____
8
____
Chip Enable to Power Up Time (2) Chip Disable to Power Down Time
(2)
____ ____
7 4 8 5
8 4 10 5
8 6 12 6
12 8 15 7
Semaphore Flag Update Pulse (OE or SEM) Semaphore Address Access Time Semaphore Output Enable Access Time
2
____
2
____
2
____
2
____
AC Electrical Characteristics Over the Operating Temperature and Supply Voltage(4)
70T651/9S8(5) Com'l Only Symbol WRITE CYCLE tWC tEW tAW tAS tWP tWR tDW tDH tWZ tOW tSWRD tSPS Write Cycle Time Chip Enable to End-of-Write
(3)
70T651/9S10 Com'l & Ind(5) Min. Max.
70T651/9S12 Com'l & Ind Min. Max.
70T651/9S15 Com'l Only Min. Max. Unit
Parameter
Min.
Max.
8 6 6 0 6 0 4 0
(1,2)
____
____ ____ ____ ____ ____ ____ ____ ____
10 7 7 0 7 0 5 0
____
____ ____ ____ ____ ____ ____ ____ ____
12 9 9 0 9 0 7 0
____
____ ____ ____ ____ ____ ____ ____ ____
15 12 12 0 12 0 10 0
____
____ ____ ____ ____ ____ ____ ____ ____
ns ns ns ns ns ns ns ns ns ns ns ns
5632 tbl 13
Address Valid to End-of-Write Address Set-up Time (3) Write Pulse Width Write Recovery Time Data Valid to End-of-Write Data Hold Time Write Enable to Output in High-Z
3.5
____ ____ ____
4
____ ____ ____
6
____ ____ ____
8
____ ____ ____
Output Active from End-of-Write (1,2) SEM Flag Write to Read Time SEM Flag Contention Window
3 4 4
3 5 5
3 5 5
3 5 5
NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 1). 2. This parameter is guaranteed by device characterization, but is not production tested. 3. To access RAM, CE= VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. Either condition must be valid for the entire tEW time. CE = VIL when CE0 = VIL and CE1 = VIH. CE = VIH when CE0 = VIH and/or CE1 = VIL. 4. These values are valid regardless of the power supply level selected for I/O and control signals (3.3V/2.5V). See page 6 for details. 5. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
11
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Waveform of Read Cycles(5)
tRC ADDR tAA (4) tACE tAOE OE tABE (4) BEn
(4) (4)
CE
(6)
R/W tLZ/tLZOB DATAOUT
(1)
tOH VALID DATA
(4) (2) .
tHZ BUSYOUT tBDD
(3,4)
5632 drw 06
NOTES: 1. Timing depends on which signal is asserted last, OE, CE or BEn. 2. Timing depends on which signal is de-asserted first CE, OE or BEn. 3. tBDD delay is required only in cases where the opposite port is completing a write operation to the same address location. For simultaneous read operations BUSY has no relation to valid output data. 4. Start of valid data depends on which timing becomes effective last tAOE, tACE, tAA, tABE or tBDD. 5. SEM = VIH. 6. CE = L occurs when CE0 = VIL and CE1 = VIH. CE = H when CE0 = VIH and/or CE1 = VIL.
Timing of Power-Up Power-Down
CE tPU ICC
50% 50%
5632 drw 07
tPD
.
ISB
12
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 1, R/W Controlled Timing(1,5,8)
tWC ADDRESS tHZ OE tAW CE or SEM
(9) (7)
BEn
(9)
tAS (6) R/W tWZ (7) DATAOUT
(4)
tWP
(2)
tWR
(3)
tOW
(7)
(4)
tDW DATAIN
tDH
5632 drw 10
.
Timing Waveform of Write Cycle No. 2, CE Controlled Timing(1,5,8)
tWC ADDRESS tAW CE or SEM
(9) (6)
tAS BEn(9)
tEW (2)
tWR(3)
R/W tDW DATAIN
5632 drw 11 .
tDH
.
NOTES: 1. R/W or CE or BEn = VIH during all address transitions for Write Cycles 1 and 2. 2. A write occurs during the overlap (tEW or tWP) of a CE = VIL, BEn = VIL, and a R/W = VIL for memory array writing cycle. 3. tWR is measured from the earlier of CE, BEn or R/W (or SEM or R/W) going HIGH to the end of write cycle. 4. During this period, the I/O pins are in the output state and input signals must not be applied. 5. If the CE or SEM = VIL transition occurs simultaneously with or after the R/W = VIL transition, the outputs remain in the High-impedance state. 6. Timing depends on which enable signal is asserted last, CE or R/W. 7. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load (Figure 1). 8. If OE = VIL during R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off and data to be placed on the bus for the required tDW. If OE = VIH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the specified tWP. 9. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. tEW must be met for either condition. CE = VIL when CE0 = VIL and CE1 = VIH. CE = VIH when CE0 = VIH and/or CE1 = VIL.
13
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
RapidWrite Mode Write Cycle
Unlike other vendors' Asynchronous Random Access Memories, the IDT70T651/9 is capable of performing multiple back-to-back write operations without having to pulse the R/W, CE, or BEn signals high during address transitions. This RapidWrite Mode functionality allows the system designer to achieve optimum back-to-back write cycle performance without the difficult task of generating narrow reset pulses every cycle, simplifying system design and reducing time to market. During this new RapidWrite Mode, the end of the write cycle is now defined by the ending address transition, instead of the R/W or CE or BEn transition to the inactive state. R/W, CE, and BEn can be held active throughout the address transition between write cycles. Care must be
taken to still meet the Write Cycle time (tWC), the time in which the Address inputs must be stable. Input data setup and hold times (tDW and tDH) will now be referenced to the ending address transition. In this RapidWrite Mode the I/O will remain in the Input mode for the duration of the operations due to R/W being held low. All standard Write Cycle specifications must be adhered to. However, tAS and tWR are only applicable when switching between read and write operations. Also, there are two additional conditions on the Address Inputs that must also be met to ensure correct address controlled writes. These specifications, the Allowable Address Skew (tAAS) and the Address Rise/Fall time (tARF), must be met to use the RapidWrite Mode. If these conditions are not met there is the potential for inadvertent write operations at random intermediate locations as the device transitions between the desired write addresses.
Timing Waveform of Write Cycle No. 3, RapidWrite Mode Write Cycle(1,3)
tWC
ADDRESS
tWC
(4)
tWC
CE or SEM
(6)
tEW
(2)
BEn
tWR
R/W
tWP tWZ
(5)
tOW tDH tDW tDW tDH tDW tDH
(5)
DATAOUT
DATAIN
5632 drw 08
NOTES: 1. OE = VIL for this timing waveform as shown. OE may equal VIH with same write functionality; I/O would then always be in High-Z state. 2. A write occurs during the overlap (tEW or tWP) of a CE = VIL, BEn = VIL, and a R/W = VIL for memory array writing cycle. The last transition LOW of CE, BEn, and R/W initiates the write sequence. The first transition HIGH of CE, BEn, and R/W terminates the write sequence. 3. If the CE or SEM = VIL transition occurs simultaneously with or after the R/W = VIL transition, the outputs remain in the High-impedance state. 4. The timing represented in this cycle can be repeated multiple times to execute sequential RapidWrite Mode writes. 5. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load (Figure 1). 6. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. tEW must be met for either condition. CE = VIL when CE0 = VIL and CE1 = VIH. CE = VIH when CE0 = VIH and/or CE1 = VIL.
14
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
AC Electrical Characteristics over the Operating Temperature Range and Supply Voltage Range for RapidWrite Mode Write Cycle(1)
Symbol tAAS tARF Parameter Allowable Address Skew for RapidWrite Mode Address Rise/Fall Time for RapidWrite Mode Min
____
Max 1
____
Unit ns V/ns
5632 tbl 14
1.5
NOTE: 1. Timing applies to all speed grades when utilizing the RapidWrite Mode Write Cycle.
Timing Waveform of Address Inputs for RapidWrite Mode Write Cycle
A0
tAAS tARF
A17
(1)
tARF
5632 drw 09
NOTE: 1. A16 for IDT70T659.
15
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Timing Waveform of Semaphore Read after Write Timing, Either Side(1)
tSAA A0-A2 VALID ADDRESS tAW SEM(1) tEW tOH tDW I/O tAS R/W tSWRD OE
Write Cycle
VALID ADDRESS tACE
tWR
tSOP DATAOUT(2) VALID
DATA IN VALID tWP tDH
tSOE tSOP
Read Cycle
5632 drw 12
.
NOTES: 1. CE0 = VIH and CE1 = VIL are required for the duration of both the write cycle and the read cycle waveforms shown above. Refer to Truth Table II for details and for appropriate BEn controls. 2. "DATAOUT VALID" represents all I/O's (I/O0 - I/O35) equal to the semaphore value.
Timing Waveform of Semaphore Write Contention(1,3,4)
A0"A"-A2"A" MATCH
SIDE
(2)
"A"
R/W"A"
SEM"A" tSPS A0"B"-A2"B" MATCH
SIDE
(2)
"B"
R/W"B"
SEM"B"
5632 drw 13 .
NOTES: 1. DOR = DOL = VIL, CEL = CER = VIH. Refer to Truth Table II for appropriate BE controls. 2. All timing is the same for left and right ports. Port "A" may be either left or right port. "B" is the opposite from port "A". 3. This parameter is measured from R/W"A" or SEM"A" going HIGH to R/W"B" or SEM"B" going HIGH. 4. If tSPS is not satisfied,the semaphore will fall positively to one side or the other, but there is no guarantee which side will be granted the semaphore flag.
16
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range
70T651/9S8(6) Com'l Only Symbol BUSY TIMING (M/S=VIH) tBAA tBDA tBAC tBDC tAPS tBDD tWH BUSY Access Time from Address Match BUSY Disable Time from Address Not Matched BUSY Access Time from Chip Enable Low BUSY Disable Time from Chip Enable High Arbitration Priority Set-up Time (2) BUSY Disable to Valid Data Write Hold After BUSY
(5) (3)
____ ____ ____ ____
Parameter
70T651/9S10 Com'l & Ind(6) Min. Max.
70T651/9S12 Com'l & Ind Min. Max.
70T651/9S15 Com'l Only Min. Max. Unit
Min.
Max.
8 8 8 8
____
____ ____ ____ ____
10 10 10 10
____
____ ____ ____ ____
12 12 12 12
____
____ ____ ____ ____
15 15 15 15
____
ns ns ns ns ns ns ns
2.5
____
2.5
____
2.5
____
2.5
____
8
____
10
____
12
____
15
____
6
7
9
12
BUSY TIMING (M/S=VIL) tWB tWH BUSY Input to Write(4) Write Hold After BUSY(5) 0 6
____ ____
0 7
____ ____
0 9
____ ____
0 12
____ ____
ns ns
PORT-TO-PORT DELAY TIMING tWDD tDDD Write Pulse to Data Delay (1) Write Data Valid to Read Data Delay (1)
____ ____
12 12
____ ____
14 14
____ ____
16 16
____ ____
20 20
ns ns
5632 tbl 15
NOTES: 1. Port-to-port delay through RAM cells from writing port to reading port, refer to "Timing Waveform of Write with Port-to-Port Read and BUSY (M/S = VIH)". 2. To ensure that the earlier of the two ports wins. 3. tBDD is a calculated parameter and is the greater of the Max. spec, tWDD - tWP (actual), or tDDD - tDW (actual). 4. To ensure that the write cycle is inhibited on port "B" during contention on port "A". 5. To ensure that a write cycle is completed on port "B" after contention on port "A". 6. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
AC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range(1,2,3)
70T651/9S8(4) Com'l Only Symbol SLEEP MODE TIMING (ZZx=VIH) tZZS tZZR tZZPD tZZPU Sleep Mode Set Time Sleep Mode Reset Time Sleep Mode Power Down Time (5) Sleep Mode Power Up Time (5) 8 8 8
____ ____ ____ ____
Parameter
70T651/9S10 Com'l & Ind(4) Min. Max.
70T651/9S12 Com'l & Ind Min. Max.
70T651/9S15 Com'l Only Min. Max.
Min.
Max.
10 10 10
____
____ ____ ____
12 12 12
____
____ ____ ____
15 15 15
____
____ ____ ____
0
0
0
0
5632 tbl 15a
NOTES: 1. Timing is the same for both ports. 2. The sleep mode pin shuts off all dynamic inputs, except JTAG inputs, when asserted. OPTx, INTx, M/S and the sleep mode pins themselves (ZZx) are not affected during sleep mode. It is recommended that boundary scan not be operated during sleep mode. 3. These values are valid regardless of the power supply level selected for I/O and control signals (3.3V/2.5V). See page 6 for details. 4. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only. 5. This parameter is guaranteed by device characterization, but is not production tested.
17
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Timing Waveform of Write with Port-to-Port Read and BUSY (M/S = VIH)(2,4,5)
tWC ADDR"A" MATCH tWP R/W"A" tDW DATAIN "A" tAPS ADDR"B" tBAA BUSY"B" tWDD DATAOUT "B" tDDD (3)
NOTES: 1. To ensure that the earlier of the two ports wins. tAPS is ignored for M/S = VIL (SLAVE). 2. CE0L = CE0R = VIL; CE1L = CE1R = VIH. 3. OE = VIL for the reading port. 4. If M/S = VIL (slave), BUSY is an input. Then for this example BUSY"A" = VIH and BUSY"B" input is shown above. 5. All timing is the same for left and right ports. Port "A" may be either the left or right port. Port "B" is the port opposite from port "A".
5632 drw 14 (1)
tDH VALID
MATCH tBDA tBDD
VALID
.
Timing Waveform of Write with BUSY (M/S = VIL)
tWP R/W"A" tWB(3) BUSY"B" tWH
(1)
R/W"B"
NOTES: 1. tWH must be met for both BUSY input (SLAVE) and output (MASTER). 2. BUSY is asserted on port "B" blocking R/W"B", until BUSY"B" goes HIGH. 3. tWB only applies to the slave mode.
(2) .
5632 drw 15
18
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Waveform of BUSY Arbitration Controlled by CE Timing (M/S = VIH)(1)
ADDR"A" and "B" ADDRESSES MATCH
CE"A" tAPS (2) CE"B" tBAC BUSY"B"
5632 drw 16
tBDC
.
Waveform of BUSY Arbitration Cycle Controlled by Address Match Timing (M/S = VIH)(1,3,4)
ADDR"A" tAPS (2) ADDR"B" MATCHING ADDRESS "N" tBAA BUSY"B"
5632 drw 17
ADDRESS "N"
tBDA
,
NOTES: 1. All timing is the same for left and right ports. Port "A" may be either the left or right port. Port "B" is the port opposite from port "A". 2. If tAPS is not satisfied, the BUSY signal will be asserted on one side or another but there is no guarantee on which side BUSY will be asserted. 3. CEX = VIL when CE0X = VIL and CE1X = VIH. CEX = VIH when CE0X = VIH and/or CE1X = VIL. 4. CE0X = OEX = BEnX = VIL. CE1X = VIH.
AC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range(1,2)
70T651/9S8(3) Com'l Only Symbol INTERRUPT TIMING tAS tWR tINS tINR Address Set-up Time Write Recovery Time Interrupt Set Time Interrupt Reset Time 0 0
____ ____ ____ ____
70T651/9S10 Com'l & Ind(3) Min. Max.
70T651/9S12 Com'l & Ind Min. Max.
70T651/9S15 Com'l Only Min. Max. Unit
Parameter
Min.
Max.
0 0
____ ____
____ ____
0 0
____ ____
____ ____
0 0
____ ____
____ ____
ns ns ns ns
5632 tbl 16
8 8
10 10
12 12
15 15
NOTES: 1. Timing is the same for both ports. 2. These values are valid regardless of the power supply level selected for I/O and control signals (3.3V/2.5V). See page 6 for details. 3. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
19
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Waveform of Interrupt Timing(1)
tWC ADDR"A" tAS(4) CE"A"(3) INTERRUPT SET ADDRESS
(2)
tWR (5)
R/W"A" tINS INT"B"
.
5632 drw 18
(4)
tRC ADDR"B" CE"B"(3) INTERRUPT CLEAR ADDRESS tAS
(4) (2)
OE"B" tINR (4) INT"B"
NOTES: 1. All timing is the same for left and right ports. Port "A" may be either the left or right port. Port "B" is the port opposite from port "A". 2. Refer to Interrupt Truth Table. 3. CEX = VIL means CE0X = VIL and CE1X = VIH. CEX = VIH means CE0X = VIH and/or CE1X = VIL. 4. Timing depends on which enable signal (CE or R/W) is asserted last. 5. Timing depends on which enable signal (CE or R/W) is de-asserted first.
5632 drw 19
.
Truth Table III -- Interrupt Flag(1,4)
Left Port R/WL L X X X CEL L X X L OEL X X X L A17L-A0L
(5)
Right Port INTL X X L(3) H(2) R/WR X X L X CER X L L X OER X L X X A17R-A0R(5) X 3FFFF 3FFFE X INTR L
(2)
Function Set Right INTR Flag Reset Right INTR Flag Set Left INTL Flag Reset Left INTL Flag
5632 tbl 17
3FFFF X X 3FFFE
H(3) X X
NOTES: 1. Assumes BUSYL = BUSYR =VIH. CE0X = VIL and CE1X = VIH. 2. If BUSYL = VIL, then no change. 3. If BUSYR = VIL, then no change. 4. INTL and INTR must be initialized at power-up. 5. A17x is a NC for IDT70T659. Therefore, Interrupt Addresses are 1FFFF and 1FFFE.
20
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Truth Table IV -- Address BUSY Arbitration
Inputs CEL(5) CER(5) X H X L X X H L AOL-A17L(4) AOR-A17R NO MATCH MATCH MATCH MATCH Outputs BUSYL(1) H H H (2) BUSYR(1) H H H (2) Function Normal Normal Normal Write Inhibit(3)
5632 tbl 18
NOTES: 1. Pins BUSYL and BUSYR are both outputs when the part is configured as a master. Both are inputs when configured as a slave. BUSY outputs on the IDT70T651/9 are push-pull, not open drain outputs. On slaves the BUSY input internally inhibits writes. 2. "L" if the inputs to the opposite port were stable prior to the address and enable inputs of this port. "H" if the inputs to the opposite port became stable after the address and enable inputs of this port. If tAPS is not met, either BUSYL or BUSYR = LOW will result. BUSYL and BUSYR outputs can not be LOW simultaneously. 3. Writes to the left port are internally ignored when BUSYL outputs are driving LOW regardless of actual logic level on the pin. Writes to the right port are internally ignored when BUSYR outputs are driving LOW regardless of actual logic level on the pin. 4. A17 is a NC for IDT70T659. Address comparison will be for A0 - A16. 5. CEX = L means CE0X = VIL and CE1X = VIH. CEX = H means CE0X = VIH and/or CE1X = VIL.
Truth Table V -- Example of Semaphore Procurement Sequence(1,2,3)
Functions No Action Left Port Writes "0" to Semaphore Right Port Writes "0" to Semaphore Left Port Writes "1" to Semaphore Left Port Writes "0" to Semaphore Right Port Writes "1" to Semaphore Left Port Writes "1" to Semaphore Right Port Writes "0" to Semaphore Right Port Writes "1" to Semaphore Left Port Writes "0" to Semaphore Left Port Writes "1" to Semaphore D0 - D35 Left 1 0 0 1 1 0 1 1 1 0 1 D0 - D35 Right 1 1 1 0 0 1 1 0 1 1 1 Semaphore free Left port has semaphore token No change. Right side has no write access to semaphore Right port obtains semaphore token No change. Left port has no write access to semaphore Left port obtains semaphore token Semaphore free Right port has semaphore token Semaphore free Left port has semaphore token Semaphore free
5632 tbl 19
Status
NOTES: 1. This table denotes a sequence of events for only one of the eight semaphores on the IDT70T651/9. 2. There are eight semaphore flags written to via I/O0 and read from all I/O's (I/O0-I/O35). These eight semaphores are addressed by A0 - A2. 3. CE = VIH, SEM = VIL to access the semaphores. Refer to the Semaphore Read/Write Control Truth Table.
The IDT70T651/9 provides two ports with separate control, address and I/O pins that permit independent access for reads or writes to any location in memory. The IDT70T651/9 has an automatic power down feature controlled by CE. The CE0 and CE1 control the on-chip power down circuitry that permits the respective port to go into a standby mode when not selected (CE = HIGH). When a port is enabled, access to the entire memory array is permitted.
Functional Description
Interrupts
If the user chooses the interrupt function, a memory location (mail
21
box or message center) is assigned to each port. The left port interrupt flag (INTL) is asserted when the right port writes to memory location 3FFFE (HEX), where a write is defined as CER = R/WR = VIL per the Truth Table. The left port clears the interrupt through access of address location 3FFFE when CEL = OEL = VIL, R/W is a "don't care". Likewise, the right port interrupt flag (INTR) is asserted when the left port writes to memory location 3FFFF (HEX) and to clear the interrupt flag (INTR), the right port must read the memory location 3FFFF. The message (36 bits) at 3FFFE or 3FFFF (1FFFF or 1FFFE for IDT70T659) is user-defined since it is an addressable SRAM location. If the interrupt function is not used, address locations 3FFFE and 3FFFF are not used
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
as mail boxes, but as part of the random access memory. Refer to Truth Table III for the interrupt operation.
Busy Logic provides a hardware indication that both ports of the RAM have accessed the same location at the same time. It also allows one of the two accesses to proceed and signals the other side that the RAM is "Busy". The BUSY pin can then be used to stall the access until the operation on the other side is completed. If a write operation has been attempted from the side that receives a BUSY indication, the write signal is gated internally to prevent the write from proceeding. The use of BUSY logic is not required or desirable for all applications. In some cases it may be useful to logically OR the BUSY outputs together and use any BUSY indication as an interrupt source to flag the event of an illegal or illogical operation. If the write inhibit function of BUSY logic is not desirable, the BUSY logic can be disabled by placing the part in slave mode with the M/S pin. Once in slave mode the BUSY pin operates solely as a write inhibit input pin. Normal operation can be programmed by tying the BUSY pins HIGH. If desired, unintended write operations can be prevented to a port by tying the BUSY pin for that port LOW. The BUSY outputs on the IDT70T651/9 RAM in master mode, are push-pull type outputs and do not require pull up resistors to operate.
A18 CE0 MASTER Dual Port RAM BUSYL BUSYR CE0 SLAVE Dual Port RAM BUSYL BUSYR
Busy Logic
The BUSY arbitration on a master is based on the chip enable and address signals only. It ignores whether an access is a read or write. In a master/slave array, both address and chip enable must be valid long enough for a BUSY flag to be output from the master before the actual write pulse can be initiated with the R/W signal. Failure to observe this timing can result in a glitched internal write inhibit signal and corrupted data in the slave.
CE1 MASTER Dual Port RAM BUSYL BUSYR
CE1 SLAVE Dual Port RAM BUSYL BUSYR
.
5632 drw 20
Figure 3. Busy and chip enable routing for both width and depth expansion with IDT70T651/9 Dual-Port RAMs.
If these RAMs are being expanded in depth, then the BUSY indication for the resulting array requires the use of an external AND gate.
When expanding an IDT70T651/9 RAM array in width while using BUSY logic, one master part is used to decide which side of the RAMs array will receive a BUSY indication, and to output that indication. Any number of slaves to be addressed in the same address range as the master use the BUSY signal as a write inhibit signal. Thus on the IDT70T651/9 RAM the BUSY pin is an output if the part is used as a master (M/S pin = VIH), and the BUSY pin is an input if the part used as a slave (M/S pin = VIL) as shown in Figure 3. If two or more master parts were used when expanding in width, a split decision could result with one master indicating BUSY on one side of the array and another master indicating BUSY on one other side of the array. This would inhibit the write operations from one port for part of a word and inhibit the write operations from the other port for the other part of the word.
22
Width Expansion with Busy Logic Master/Slave Arrays
The IDT70T651/9 is an extremely fast Dual-Port 256/128K x 36 CMOS Static RAM with an additional 8 address locations dedicated to binary semaphore flags. These flags allow either processor on the left or right side of the Dual-Port RAM to claim a privilege over the other processor for functions defined by the system designer's software. As an example, the semaphore can be used by one processor to inhibit the other from accessing a portion of the Dual-Port RAM or any other shared resource. The Dual-Port RAM features a fast access time, with both ports being completely independent of each other. This means that the activity on the left port in no way slows the access time of the right port. Both ports are identical in function to standard CMOS Static RAM and can be read from or written to at the same time with the only possible conflict arising from the simultaneous writing of, or a simultaneous READ/WRITE of, a non-semaphore location. Semaphores are protected against such ambiguous situations and may be used by the system program to avoid any conflicts in the non-semaphore portion of the Dual-Port RAM. These devices have an automatic power-down feature controlled by CE0 and CE1, the Dual-Port RAM chip enables, and SEM, the semaphore enable. The CE0, CE1, and SEM pins control onchip power down circuitry that permits the respective port to go into standby mode when not selected. Systems which can best use the IDT70T651/9 contain multiple processors or controllers and are typically very high-speed systems which are software controlled or software intensive. These systems can benefit from a performance increase offered by the IDT70T651/9s hardware semaphores, which provide a lockout mechanism without requiring complex programming. Software handshaking between processors offers the maximum in system flexibility by permitting shared resources to be allocated in varying configurations. The IDT70T651/9 does not use its semaphore flags to control any resources through hardware, thus allowing the system designer total flexibility in system architecture. An advantage of using semaphores rather than the more common methods of hardware arbitration is that wait states are never incurred in either processor. This can prove to be a major advantage in very high-speed systems.
Semaphores
The semaphore logic is a set of eight latches which are independent of the Dual-Port RAM. These latches can be used to pass a flag, or token, from one port to the other to indicate that a shared resource is in use. The semaphores provide a hardware assist for a use assignment method called "Token Passing Allocation." In this method, the state of a semaphore latch is used as a token indicating that a shared resource is in use. If the left processor wants to use this resource, it requests the token by setting the latch. This processor then
How the Semaphore Flags Work
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
verifies its success in setting the latch by reading it. If it was successful, it proceeds to assume control over the shared resource. If it was not successful in setting the latch, it determines that the right side processor has set the latch first, has the token and is using the shared resource. The left processor can then either repeatedly request that semaphore's status or remove its request for that semaphore to perform another task and occasionally attempt again to gain control of the token via the set and test sequence. Once the right side has relinquished the token, the left side should succeed in gaining control. The semaphore flags are active LOW. A token is requested by writing a zero into a semaphore latch and is released when the same side writes a one to that latch. The eight semaphore flags reside within the IDT70T651/9 in a separate memory space from the Dual-Port RAM. This address space is accessed by placing a low input on the SEM pin (which acts as a chip select for the semaphore flags) and using the other control pins (Address, CE0, CE1,R/W and BEn) as they would be used in accessing a standard Static RAM. Each of the flags has a unique address which can be accessed by either side through address pins A0 - A2. When accessing the semaphores, none of the other address pins has any effect. When writing to a semaphore, only data pin D0 is used. If a low level is written into an unused semaphore location, that flag will be set to a zero on that side and a one on the other side (see Truth Table V). That semaphore can now only be modified by the side showing the zero. When a one is written into the same location from the same side, the flag will be set to a one for both sides (unless a semaphore request from the other side is pending) and then can be written to by both sides. The fact that the side which is able to write a zero into a semaphore subsequently locks out writes from the other side is what makes semaphore flags useful in interprocessor communications. (A thorough discussion on the use of this feature follows shortly.) A zero written into the same location from the other side will be stored in the semaphore request latch for that side until the semaphore is freed by the first side. When a semaphore flag is read, its value is spread into all data bits so that a flag that is a one reads as a one in all data bits and a flag containing a zero reads as all zeros for a semaphore read, the SEM, BEn, and OE signals need to be active. (Please refer to Truth Table II). Furthermore, the read value is latched into one side's output register when that side's semaphore select (SEM, BEn) and output enable (OE) signals go active. This serves to disallow the semaphore from changing state in the middle of a read cycle due to a write cycle from the other side. A sequence WRITE/READ must be used by the semaphore in order to guarantee that no system level contention will occur. A processor requests access to shared resources by attempting to write a zero into a semaphore location. If the semaphore is already in use, the semaphore request latch will contain a zero, yet the semaphore flag will appear as one, a fact which the processor will verify by the subsequent read (see Table V). As an example, assume a processor writes a zero to the left port at a free semaphore location. On a subsequent read, the processor will verify that it has written successfully to that location and will assume control over the resource in question. Meanwhile, if a processor on the right side attempts to write a zero to the same semaphore flag it will fail, as will be verified by the fact that a one will be read from that semaphore on the right side during subsequent read. Had a sequence of READ/WRITE been used instead, system contention problems could have occurred during
23
the gap between the read and write cycles. It is important to note that a failed semaphore request must be followed by either repeated reads or by writing a one into the same location. The reason for this is easily understood by looking at the simple logic diagram of the semaphore flag in Figure 4. Two semaphore request latches feed into a semaphore flag. Whichever latch is first to present a zero to the semaphore flag will force its side of the semaphore flag LOW and the other side HIGH. This condition will continue until a one is written to the same semaphore request latch. If the opposite side semaphore request latch has been written to zero in the meantime, the semaphore flag will flip over to the other side as soon as a one is written into the first request latch. The opposite side flag will now stay LOW until its semaphore request latch is written to a one. From this it is easy to
L PORT SEMAPHORE REQUEST FLIP FLOP D0 WRITE
D Q
R PORT SEMAPHORE REQUEST FLIP FLOP
Q D
D0 WRITE
SEMAPHORE READ
Figure 4. IDT70T651/9 Semaphore Logic
SEMAPHORE READ
5632 drw 21
understand that, if a semaphore is requested and the processor which requested it no longer needs the resource, the entire system can hang up until a one is written into that semaphore request latch. The critical case of semaphore timing is when both sides request a single token by attempting to write a zero into it at the same time. The semaphore logic is specially designed to resolve this problem. If simultaneous requests are made, the logic guarantees that only one side receives the token. If one side is earlier than the other in making the request, the first side to make the request will receive the token. If both requests arrive at the same time, the assignment will be arbitrarily made to one port or the other. One caution that should be noted when using semaphores is that semaphores alone do not guarantee that access to a resource is secure. As with any powerful programming technique, if semaphores are misused or misinterpreted, a software error can easily happen. Initialization of the semaphores is not automatic and must be handled via the initialization program at power-up. Since any semaphore request flag which contains a zero must be reset to a one, all semaphores on both sides should have a one written into them at initialization from both sides to assure that they will be free when needed.
Timing Waveform of Sleep Mode(1,2)
al Norm Operation N newreads or writes allowed o ode Sleep M N reads or writes allowed o
al N orm Operation
CE0 tZZS
tZZR
ZZ
,
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
24
SS DRE VALIDAD ATA ALIDD V tZZPD IZZ tZZPU
5632 drw22
RESS ADD
DATA
IDD
Preliminary Industrial and Commercial Temperature Ranges
NOTES: 1. CE1 = VIH. 2. All timing is same for Left and Right ports.
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
The IDT70T651/9 is equipped with an optional sleep or low power mode on both ports. The sleep mode pin on both ports is active high. During normal operation, the ZZ pin is pulled low. When ZZ is pulled high, the port will enter sleep mode where it will meet lowest possible power conditions. The sleep mode timing diagram shows the modes of operation: Normal Operation, No Read/Write Allowed and Sleep Mode. For a period of time prior to sleep mode and after recovering from sleep mode (tZZS and tZZR), new reads or writes are not allowed. If a write or read
Sleep Mode
operation occurs during these periods, the memory array may be corrupted. Validity of data out from the RAM cannot be guaranteed immediately after ZZ is asserted (prior to being in sleep). During sleep mode the RAM automatically deselects itself. The RAM disconnects its internal buffer. All outputs will remain in high-Z state while in sleep mode. All inputs are allowed to toggle. The RAM will not be selected and will not perform any reads or writes.
JTAG Timing Specifications
tJF TCK tJCL tJCYC tJR tJCH
Device Inputs(1)/ TDI/TMS tJS Device Outputs(2)/ TDO TRST
5632 drw 23
tJH
tJDC
tJRSR
tJCD x
tJRST
NOTES: 1. Device inputs = All device inputs except TDI, TMS, TCK and TRST. 2. Device outputs = All device outputs except TDO.
JTAG AC Electrical Characteristics(1,2,3,4,5)
70T651/9 Symbol tJCYC tJCH tJCL tJR tJF tJRST tJRSR tJCD tJDC tJS tJH Parameter JTAG Clock Input Period JTAG Clock HIGH JTAG Clock Low JTAG Clock Rise Time JTAG Clock Fall Time JTAG Reset JTAG Reset Recovery JTAG Data Output JTAG Data Output Hold JTAG Setup JTAG Hold Min. 100 40 40
____ ____
Max.
____ ____ ____
Units ns ns ns ns ns ns ns ns ns ns ns
5632 tbl 20
3
(1)
3(1)
____ ____
50 50
____
25
____ ____ ____
0 15 15
NOTES: 1. Guaranteed by design. 2. 30pF loading on external output signals. 3. Refer to AC Electrical Test Conditions stated earlier in this document. 4. JTAG operations occur at one speed (10MHz). The base device may run at any speed specified in this datasheet. 5. JTAG cannot be tested in sleep mode.
25
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Identification Register Definitions
Instruction Field Revision Number (31:28) IDT Device ID (27:12) IDT JEDEC ID (11:1) ID Register Indicator Bit (Bit 0)
NOTE: 1. Device ID for IDT70T659 is 0x339.
Value 0x0 0x338(1) 0x33 1 Reserved for version number
Description
Defines IDT part number 70T651 Allows unique identification of device vendor as IDT Indicates the presence of an ID register
5632 tbl 21
Scan Register Sizes
Register Name Instruction (IR) Bypass (BYR) Identification (IDR) Boundary Scan (BSR) Bit Size 4 1 32 Note (3)
5632 tbl 22
System Interface Parameters
Instruction EXTEST BYPASS IDCODE Code 0000 1111 0010 0100 Description Forces contents of the boundary scan cells onto the device outputs (1). Places the boundary scan register (BSR) between TDI and TDO. Places the bypass register (BYR) between TDI and TDO. Loads the ID register (IDR) with the vendor ID code and places the register between TDI and TDO. Places the bypass register (BYR) between TDI and TDO. Forces all device output drivers to a High-Z state. Uses BYR. Forces contents of the boundary scan cells onto the device outputs. Places the bypass register (BYR) between TDI and TDO. Places the boundary scan register (BSR) between TDI and TDO. SAMPLE allows data from device inputs (2) and outputs (1) to be captured in the boundary scan cells and shifted serially through TDO. PRELOAD allows data to be input serially into the boundary scan cells via the TDI. Several combinations are reserved. Do not use codes other than those identified above.
5632 tbl 23
HIGHZ CLAMP SAMPLE/PRELOAD
0011 0001
RESERVED
All Other Codes
NOTES: 1. Device outputs = All device outputs except TDO. 2. Device inputs = All device inputs except TDI, TMS, TCK and TRST. 3. The Boundary Scan Descriptive Language (BSDL) file for this device is available on the IDT website (www.idt.com), or by contacting your local IDT sales representative.
26
IDT70T651/9S High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM
Preliminary Industrial and Commercial Temperature Ranges
Ordering Information
IDT XXXXX Device Type A Power 999 Speed A Package A Process/ Temperature Range Commercial (0C to +70C) Industrial (-40C to +85C)
Blank I
BC DR BF
256-ball BGA (BC-256) 208-pin PQFP (DR-208) 208-ball fpBGA (BF-208)
8 10 12 15 S
Commercial Only(1) Commercial & Industrial(1) Commercial & Industrial Commercial Only Standard Power
.
Speed in nanoseconds
70T651 9Mbit (256K x 36) Asynchronous Dual-Port RAM 70T659 4Mbit (128K x 36) Asynchronous Dual-Port RAM
5632 drw 24
NOTE: 1. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
Preliminary Datasheet: Definition
"PRELIMINARY' datasheets contain descriptions for products that are in early release.
Datasheet Document History:
04/25/03: Initial Datasheet 10/01/03: Page 9 Added 8ns speed DC power numbers to DC Electrical Characteristics Table Page 9 Updated DC power numbers for 10, 12 & 15ns speeds in the DC Electrical Characteristics Table Page 9, 11, 15, 17 & 25 Added footnote that indicates that 8ns speed is available in BF-208 and BC-256 packages only Page 10 Added Capacitance Derating Drawing Page 11, 15 & 17 Added 8ns AC timing numbers to the AC Electrical Characteristics Tables Page 11 Added tSOE and tLZOB to the AC Read Cycle Electrical Characteristics Table Page 12 Added tLZOB to the Waveform of Read Cycles Drawing Page 14 Added tSOE to Timing Waveform of Semaphore Read after Write Timing, Either Side Drawing Page 1 & 25 Added 8ns speed grade and 10ns I-temp to features and to ordering information Page 1, 14 & 15 Added RapidWrite Mode Write Cycle text and waveforms 10/20/03: Page 15 Corrected tARF to 1.5V/ns Min. CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054 for SALES: 800-345-7015 or 408-727-6116 fax: 408-492-8674 www.idt.com for Tech Support: 831-754-4613 DualPortHelp@idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
27


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